Title :
A system to measure current transducer performance
Author :
Waltrip, B.C. ; Nelson, T.L.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
A special purpose ac current transducer measurement system capable of intercomparing transducers with ac output voltage ratios from 1:1 to 50:1 has been developed to extend the range and accuracy of current transformer, current shunt, and mutual inductor calibrations at power frequencies of 50 Hz and 60 Hz. The system consists of a two-stage binary inductive voltage divider, an amplifier-aided two-stage current transformer, a precision shunt, a wideband buffer, and a commercial, sampling digital multimeter (DMM). When comparing current transducers with ac output voltage ratios of 1:1 to 50:1, the system attains an overall relative standard uncertainty of the ratio of 10/sup -5/ to 10/sup -4/, respectively. The basic system can be used to calibrate transducers with input currents of 0.1 A to 200 A (RMS) and can be extended to measure devices handling input currents up to 15 kA.
Keywords :
bridge circuits; buffer circuits; calibration; current comparators; current transformers; digital multimeters; measurement systems; measurement uncertainty; operational amplifiers; signal sampling; voltage dividers; wave analysers; 0.1 to 200 A; 15 kA; 50 Hz; 60 Hz; AC current transducer measurement system; amplifier-aided two-stage current transformer; calibration; comparison bridge; current shunt; intercomparing transducers; least squares algorithm; mutual inductor; precision shunt; range extension; relative standard uncertainty; sampling digital multimeter; sampling system; special purpose system; system controller software; two-stage binary inductive voltage divider; wideband buffer; Broadband amplifiers; Calibration; Current measurement; Current transformers; Frequency conversion; Frequency measurement; Inductors; Power measurement; Shunt (electrical); Transducers;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699903