DocumentCode :
2946448
Title :
Magnetic and Writing Properties of Clad Lines in a Toggle MRAM
Author :
Shimura, K. ; Ohshima, N. ; Miura, S. ; Nebashi, R. ; Suzuki, T. ; Hada, H. ; Tahara, S. ; Aikawa, H. ; Ueda, T. ; Kajiyama, T. ; Yoda, H.
Author_Institution :
NEC Corp., Sagamihara
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
733
Lastpage :
733
Abstract :
Savtchenko proposed a toggle MRAM in which the half-selected writing disturb phenomena is eliminated. The writing currents of the toggle MRAM were high. To reduce the current, magnetic cladding was used for both the word and bit lines. However, the structure of the clad line has not been reported yet. We investigated the relation between the magnetic properties and structures of the clad line by changing the deposition conditions. Moreover, we applied the optimized clad lines to toggle memories.
Keywords :
claddings; coercive force; magnetic storage; magnetic susceptibility; random-access storage; remanence; clad lines; half-selected writing disturb phenomena; magnetic cladding; magnetic properties; toggle MRAM; writing currents; writing properties; Crystallization; Extraterrestrial measurements; Laboratories; Magnetic films; Magnetic hysteresis; Magnetic properties; Magnetic susceptibility; National electric code; Remanence; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.376457
Filename :
4262166
Link To Document :
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