Title :
On-wafer single contact quadrature accuracy measurement using receiver mode in four-port vector network analyzer
Author :
Chang, Yin-Cheng ; Hsu, Yuan-Chia ; Lin, Shuw-Guann ; Juang, Ying-Zong ; Chiou, Hwann-Kaeo
Author_Institution :
Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan, R.O.C.
Abstract :
This paper presents the calibration procedure using a five-port calibration kit based on receiver mode in vector network analyzer (VNA). After de-embedding the phase/amplitude errors from cal-kit, the quadrature phase accuracy and amplitude error of a quadrature voltage controlled oscillator (QVCO) can be directly obtained using on-wafer testing with a single contact. A 5 GHz QVCO was tested to demonstrate the feasibility of measurement. The I/Q mismatch on both phase and amplitude of the QVCO were precisely measured. Only single probe contact is required during the measurement that minimizes the uncertainty.
Keywords :
calibration; circuit testing; errors; microwave measurement; microwave oscillators; multiport networks; network analysers; voltage-controlled oscillators; amplitude error; de-embedding; five-port calibration kit; four-port vector network analyzer; frequency 5 GHz; on-wafer testing; phase error; quadrature phase accuracy; quadrature voltage controlled oscillator; receiver mode; single probe contact; Amplitude modulation; Calibration; Frequency; Instruments; Performance evaluation; Phase measurement; Phase modulation; Q measurement; Testing; Voltage-controlled oscillators; QVCO; Quadrature accuracy; amplitude error; phase calibration; phase error;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633180