Title :
Effect of roughness on third-order nonlinear-optical susceptibility of rare earth doped zinc oxide thin films
Author :
Addoua, M. ; Jouad, M. El ; Lamrani, A.M. ; Sofian, Z. ; Sahraoui, Bouchta ; Monteil, A. ; Gaumer, N. ; Dabos, S. ; El Habbani, T. ; Fellah, N. ; Bahedi, K. ; Dghoughia, L.
Author_Institution :
Physico-Chimie des Mater. Univ. Ibn Tofail, Kenitra
Abstract :
Zinc oxide (ZnO) and erbium doped zinc oxide (ZnO:Er) thin films, were deposited on heated glass substrates using spray pyrolysis technique. Third-order nonlinear-optical properties of ZnO and ZnO:Er have been investigated by the third harmonic generation (THG) method at the wavelength of 1064 nm using nanosecond Nd3+:YAG laser radiation. The dependence of third order nonlinear susceptibility and transmission characteristics on the thin film roughness has been measured. Third order nonlinear optical susceptibility ( chi(3)) values of the studied materials were in the remarkable range of 10-12 esu. The deposited films have been analyzed using X-ray diffraction (XRD) and atomic force microscopy (AFM).
Keywords :
II-VI semiconductors; X-ray diffraction; atomic force microscopy; erbium; light transmission; nonlinear optical susceptibility; optical films; optical harmonic generation; semiconductor thin films; spray coatings; surface roughness; wide band gap semiconductors; zinc compounds; AFM; SiO2; THG method; X-ray diffraction; XRD; ZnO:Er; atomic force microscopy; erbium doped zinc oxide films; heated glass substrate; nanosecond Nd3+:YAG laser radiation; optical transmission; rare earth doped zinc oxide thin film; spray pyrolysis; surface roughness; third harmonic generation; third-order nonlinear-optical susceptibility; wavelength 1064 nm; Atomic force microscopy; Erbium; Glass; Optical films; Optical harmonic generation; Spraying; Sputtering; Substrates; Transistors; Zinc oxide; THG; ZnO; roughness; spray; thin films;
Conference_Titel :
ICTON Mediterranean Winter Conference, 2007. ICTON-MW 2007
Conference_Location :
Sousse
Print_ISBN :
978-1-4244-1639-4
Electronic_ISBN :
978-1-4244-1639-4
DOI :
10.1109/ICTONMW.2007.4446957