DocumentCode :
2946771
Title :
Compression of PD patterns by means of neural networks
Author :
Bozzo, R. ; Coletti, G. ; Gemme, C. ; Guastavino, F. ; Sciutto, Luca
Author_Institution :
Dept. of Electr. Eng., Genoa Univ., Italy
Volume :
2
fYear :
1997
fDate :
19-22, Oct 1997
Firstpage :
504
Abstract :
The paper describes how the use of statistical tools and the implementation of neural networks have been jointly exploited to process PD patterns derived from experimental data relevant to electrical treeing phenomena in EPR compounds. We show that the overall output of the proposed analysis method allows us to discriminate between different materials, in which the treeing structures are present. In particular, we present evidence that a NN approach can be successfully adopted to select an appropriate subset of ten parameters (out of 56 different quantities computed applying to the “raw” data statistical tools). Such a subset can then be used as a new input data set to train/test other neural networks with comparable error rates
Keywords :
data compression; ethylene-propylene rubber; feature extraction; insulation testing; learning (artificial intelligence); multilayer perceptrons; partial discharges; power cable insulation; power engineering computing; statistical analysis; EPR compounds; HV cable insulation; PD pattern compression; electrical treeing phenomena; error rates; high relevance feature identification; input data set; neural network training; neural networks; perceptron architecture; statistical tools; two-layer MLP structure; Cables; Current measurement; Dielectrics and electrical insulation; Materials testing; Neural networks; Paramagnetic resonance; Partial discharge measurement; Partial discharges; Trees - insulation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-3851-0
Type :
conf
DOI :
10.1109/CEIDP.1997.641121
Filename :
641121
Link To Document :
بازگشت