Title :
The development of microwave power amplifiers and nonlinear measurement systems - is the measurement systems manufacturer still lead by the PA designer?
Author :
Mikkelsen, Jan H. ; Tafuri, Felice F. ; Nielsen, Troels S. ; Ming Shen ; Wei Wei ; Jensen, Ole K.
Author_Institution :
Dept. of Electron. Syst., Aalborg Univ., Aalborg, Denmark
Abstract :
Developments within modern nonlinear measurement systems offer an increasing degree of flexibility to the microwave power amplifier (PA) designer. The PA designer has historically been a driving factor in setting the development directions of new measurement systems, fueling the paradigm, that PA innovations largely push new measurement requirements. It would appear that measurement system manufacturers are now the ones pushing the technology envelope. This paper discusses current trends within modern nonlinear measurement systems to determine who is leading whom and whether the aforementioned paradigm is shifting.
Keywords :
measurement systems; microwave power amplifiers; PA designer; measurement system manufacturers; microwave power amplifier designer; modern nonlinear measurement systems; technology envelope; GSM; Integrated circuit modeling; Load modeling; Peak to average power ratio; Radio frequency; Scattering parameters; Topology; measurement technology; modeling; power amplifiers;
Conference_Titel :
Telecommunications Forum (TELFOR), 2013 21st
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-1419-7
DOI :
10.1109/TELFOR.2013.6716239