Title :
Elaboration and study of optical properties of CdSe nanocrystals dispersed in a KBr monocrystalline crystalline matrix and in a thin film of SiO2 amorphous matrix
Author :
Chaieb, A. ; Halimi, O. ; Boudine, B. ; Bouhdjar, L. ; Essaidi, Z. ; Sebais, M. ; Bakasse, M.
Author_Institution :
Univ. of Constantine, Constantine
Abstract :
In this work, we firstly present the elaboration of CdSe nanocrystals (NCs) dispersed in a KBr crystalline matrix in order to build nanostructured composed materials showing monocrystalline structure, and also using another technique, to deposit thin film of amorphous silica (SiO2) containing CdSe quantum dots. These elaborated guest-host systems were investigated for potential applications in optoelectronic field. In the second part of this work, we present the structural and optical properties of these composite materials using several techniques: X-ray-diffraction (XRD), UV-visible absorption. Crystallites size estimated from XRD is equal 27 nm. Optical absorption shows size quantization effect marked by a blue shift by 0.308 eV from its standard bulk band gap value 1.7 eV. Comparing size determined by XRD crystallites size estimated from the blue shift was found to be smaller.
Keywords :
II-VI semiconductors; X-ray diffraction; amorphous state; cadmium compounds; composite materials; crystallites; energy gap; nanostructured materials; semiconductor quantum dots; silicon compounds; spectral line shift; ultraviolet spectra; visible spectra; wide band gap semiconductors; CdSe-SiO2; UV-visible absorption; X-ray-diffraction; XRD; amorphous matrix; amorphous silica thin film; blue shift; bulk band gap; monocrystalline matrix; nanocrystals; optical absorption; quantum dots; Amorphous materials; Crystalline materials; Crystallization; Electromagnetic wave absorption; Nanocrystals; Nanostructured materials; Optical films; Optical materials; Sputtering; X-ray scattering;
Conference_Titel :
ICTON Mediterranean Winter Conference, 2007. ICTON-MW 2007
Conference_Location :
Sousse
Print_ISBN :
978-1-4244-1639-4
Electronic_ISBN :
978-1-4244-1639-4
DOI :
10.1109/ICTONMW.2007.4446962