• DocumentCode
    2947066
  • Title

    Low noise amplifier for 180 GHz frequency band

  • Author

    Kangaslahti, Pekka ; Pukala, David ; Gaier, Todd ; Deal, William ; Mei, Xiaobing ; Lai, Richard

  • Author_Institution
    Jet Propulsion Laboratory, California Institute of Technology, Pasadena, 91109, USA
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    451
  • Lastpage
    454
  • Abstract
    Measurement of the humidity profile of the atmosphere is highly important for atmospheric science and weather forecasting. This sounding measurement is obtained at frequencies close to the resonance frequency of water molecules (183 GHz). We have designed and characterized a MMIC low noise amplifier that will increase the sensitivity of sounding instruments at these frequencies. This study demonstrated a factor of two improvement in MMIC LNA noise temperature at this frequency band. The measured packaged InP monolithic millimeter-wave integrated circuit (MMIC) amplifier had a noise temperature of NT=390 K (NF=3.7 dB). The circuit was fabricated in 35 nm InP high electron mobility transistor (HEMT) process.
  • Keywords
    MMIC amplifiers; low noise amplifiers; HEMT process; MMIC low noise amplifier; atmosphere humidity profile; atmospheric science; frequency 180 GHz; frequency 183 GHz; frequency band; high electron mobility transistor; monolithic microwave integrated circuits; monolithic millimeter-wave integrated circuit amplifier; resonance frequency; size 35 nm; sounding instruments; water molecules; weather forecasting; Acoustic noise; Atmospheric measurements; Frequency; HEMTs; Humidity measurement; Indium phosphide; Integrated circuit noise; Low-noise amplifiers; MMICs; Temperature sensors; MMIC.; high electron mobility transistors (HEMTs); indium phosphide; millimeter wave field-effect transistor (FET) amplifiers; monolithic millimeter wave integ low noise amplifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633200
  • Filename
    4633200