• DocumentCode
    2947381
  • Title

    A novel boundary element method with surface conductive absorbers for 3-D analysis of nanophotonics

  • Author

    Zhang, Lei ; Lee, Jung Hoon ; Farjadpour, Ardavan ; White, Jacob ; Johnson, Steven

  • Author_Institution
    Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, 02142 USA
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    523
  • Lastpage
    526
  • Abstract
    Fast integral equation solvers seem to be ideal approaches for simulating 3-D nanophotonic devices, as these devices generate fields both in an interior channel and in the infinite exterior domain. However, many devices of interest have channels that cannot be terminated without generating numerical reflections. Generating absorbers for these channels is a new problem for integral equation methods, as integral equation methods were initially developed for problems with finite surfaces. In this paper we show that the obvious approach for eliminating reflections, making the channel mildly conductive outside the domain of interest, is quite inaccurate. Instead, we propose a new method which uses a gradually varying surface conductivity to act as an absorber. Experiments are presented to demonstrate that this new method is orders of magnitude more effective than a volume absorber, and is easily incorporated in a fast integral equation solver.
  • Keywords
    integral equations; nanophotonics; surface conductivity; 3D analysis; boundary element method; fast integral equation solver; nanophotonics; surface conductive absorbers; Boundary element methods; Conductivity; Finite difference methods; Integral equations; Magnetic fields; Nanophotonics; Optical reflection; Optical surface waves; Optical waveguides; Surface waves; boundary element method; nanophotonics; optical taper; surface conductive absorber; surface integral equation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633218
  • Filename
    4633218