Title :
Sensitivity analysis of S-parameters Including port variations using the Transfinite Element Method
Author :
Vardapetyan, L. ; Manges, J. ; Cendes, Z.
Author_Institution :
Ansoft Corporation, Pittsburgh, Pennsylvania 15219, USA
Abstract :
Sensitivity analysis of microwave devices with respect to design parameters is presented. Ports are included in the computational domain via the Transfinite Element Method. The derivative of the system matrix is computed analytically. In particular, derivatives of the system matrix entries that depend on ports are obtained by analytical differentiation of the port eigenvalue problem. Numerical examples confirm the effectiveness of the proposed approach.
Keywords :
differentiation; eigenvalues and eigenfunctions; finite element analysis; matrix algebra; microwave devices; sensitivity analysis; S-parameters; analytical differentiation; computational domain; design parameters; microwave devices; port eigenvalue problem; port variations; sensitivity analysis; system matrix; transfinite element method; Design automation; Eigenvalues and eigenfunctions; Electromagnetic scattering; Finite element methods; Microwave devices; Microwave theory and techniques; Scattering parameters; Sensitivity analysis; Symmetric matrices; Transmission line matrix methods; Design automation; electromagnetic scattering; finite element methods; microwave devices; sensitivity;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633219
