DocumentCode :
2947665
Title :
A rigorous solution to the low-frequency breakdown in the electric field integral equation
Author :
Zhu, Jianfang ; Omar, Saad ; Chai, Wenwen ; Jiao, Dan
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2011
fDate :
3-8 July 2011
Firstpage :
3214
Lastpage :
3217
Abstract :
The low-frequency breakdown problem in electric field integral equation (EFIE) is well recognized and has been extensively studied. However, existing approaches have not rigorously solved the problem yet since they rely on low-frequency approximations. In this work, we present a rigorous method to fundamentally eliminate the problem. In this method, the original frequency dependent problem is rigorously transformed to a generalized eigenvalue problem, from the solution of which the frequency dependence of the EFIE solution can be analytically derived. The rigor of the proposed method has been validated at frequencies as low as DC. As the first rigorous solution to EFIE at low frequencies, the proposed method can be used to benchmark the accuracy of existing low-frequency EFIE-based solvers, quantitatively answer critical design questions such as at which frequency full-wave effects become important, etc.
Keywords :
approximation theory; eigenvalues and eigenfunctions; electric breakdown; electromagnetic fields; frequency-domain analysis; integral equations; EFIE; electric field integral equation; frequency dependent problem; generalized eigenvalue problem; low-frequency approximations; low-frequency breakdown; Antennas; Approximation methods; Eigenvalues and eigenfunctions; Electric breakdown; Frequency dependence; Integral equations; Maxwell equations; Electric field integral equation (EFIE); electromagnetic analysis; full-wave analysis; low frequency breakdown;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
Conference_Location :
Spokane, WA
ISSN :
1522-3965
Print_ISBN :
978-1-4244-9562-7
Type :
conf
DOI :
10.1109/APS.2011.5997218
Filename :
5997218
Link To Document :
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