• DocumentCode
    2947709
  • Title

    Brain surface electrode co-registration using MRI and x-ray

  • Author

    Miller, Kai J. ; Hebb, Adam O. ; Hermes, Dora ; Nijs, Marcel Den ; Ojemann, Jeffrey G. ; Rao, Rajesh P N

  • Author_Institution
    Neurobiol. & Behavior, Phys., Univ. of Washington, Seattle, WA, USA
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 4 2010
  • Firstpage
    6015
  • Lastpage
    6018
  • Abstract
    Electrocorticographic recording is now being used in a wide variety of experimental settings. We present a simple method which can be used to estimate electrode position with respect to brain gyral anatomy using a pre-implantation MRI and post-implantation coronal and sagittal x-rays. It is semi-automated, with the user manually rotating and scaling an x-ray to fit brain outline, identifying threshold values for brain surface rendering, and clicking on electrodes on an x-ray. Electrode positions can be rapidly identified and rendered in about 20 minutes from start to finish. This approach is useful when the MRI quality is poor, there is no quality CT, but one would like to understand the relationship between experimental result and brain anatomy.
  • Keywords
    bioelectric phenomena; biomedical MRI; biomedical electrodes; brain; computerised tomography; image registration; medical image processing; prosthetics; rendering (computer graphics); CT; brain gyral anatomy; brain surface electrode coregistration; brain surface rendering; electrocorticographic recording; electrode positions; post-implantation coronal X-ray; post-implantation sagittal X-rays; preimplantation MRI; Brain; Computed tomography; Electrodes; Magnetic resonance imaging; Rendering (computer graphics); Surface fitting; X-ray imaging; Brain; Electrodes, Implanted; Humans; Image Interpretation, Computer-Assisted; Magnetic Resonance Imaging; Speech; Surface Properties; X-Rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
  • Conference_Location
    Buenos Aires
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4123-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2010.5627597
  • Filename
    5627597