Support-vector-regression-based output space-mapping for microwave device modeling

An enhancement of the space mapping (SM) surrogate model through support vector regression is presented. This technique uses a standard SM model (trend function) and support vector regression to model the residuals between the fine model and the standard model. The latter is implemented as a additive output SM term. The proposed methodology offers efficient utilization of the available fine model data (not possible in the standard SM modeling) and accuracy comparable or better than the recently published modeling techniques combining SM with radial basis functions and fuzzy systems. Examples demonstrate the robustness of our approach.