• DocumentCode
    2947983
  • Title

    Anomalous temperature variation of interlayer exchange coupling in CoFe/Bi/Co trilayers

  • Author

    Hsu, J. ; Xue, Z.

  • Author_Institution
    Nat. Taiwan Univ., Taipei
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    819
  • Lastpage
    819
  • Abstract
    In this study different temperature dependences have been observed for ferromagnetic (FM) and anti-ferromagnetic (AFM) couplings. A theoretical modeling will be proposed in the presentation to account for this unusual thermal effect. CoFe/Bi/Co sandwich samples were synthesized using dc sputtering at room temperature. The crystal structure and the cross-sectional microstructures of the films were investigated by X-ray diffraction (XRD) using Cu-Kalpha radiation and 300 KeV high-resolution transmission electron microscopy (HRTEM). The magnetic properties were determined from a vibrating sample magnetometer (VSM).The representative magnetization loops of trilayer samples with various spacer thicknesses measured at 150K, 200K and 300 K respectively were determined.
  • Keywords
    X-ray diffraction; antiferromagnetic materials; bismuth; cobalt; cobalt alloys; exchange interactions (electron); ferromagnetic materials; iron alloys; magnetic hysteresis; magnetic multilayers; transmission electron microscopy; CoFe-Bi-Co - Interface; X-ray diffraction; XRD; anomalous temperature variation; antiferromagnetic couplings; crystal structure; dc sputtering; ferromagnetic couplings; high-resolution transmission electron microscopy; hysteresis loops; interlayer exchange coupling; magnetic properties; magnetization loops; microstructures; temperature 293 K to 298 K; trilayers; vibrating sample magnetometer; Antiferromagnetic materials; Atomic force microscopy; Bismuth; Crystal microstructure; Electrons; Magnetic films; Sputtering; Temperature dependence; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.374850
  • Filename
    4262252