• DocumentCode
    2948125
  • Title

    Tunneling, giant zero bias conductance, and polarized carriers injection from La2/3Ca1/3MnO3 epitaxial films

  • Author

    Saldarriaga, W. ; Moran, O. ; Baca, E.

  • Author_Institution
    Univ. del Valle, Call
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    827
  • Lastpage
    827
  • Abstract
    YBa2Cu3O7-delta/La1/3Ca2/3MnO3/La2/3Ca1/3MnO3 junctions with nominal thicknesses of 100, 7, and 80 nm respectively were fabricated by dc sputtering technique and their electrical properties determined.The superconducting gap-like structure was observed, suggesting a transport mechanism via elastic tunneling. On the other hand, for junctions with a barrier resistance of 30 Omega a pronounced zero-bias conductance peak was obtained. The value of the conductance G (V = 0) decreased as the temperature was increased, which is an indication of the metallic-like behavior associated to the presence of pin-holes on the junction area. The spin-polarized carrier injection from the F layer through the AF layer provoked a strong reduction of the critical superconducting current with an efficiency as large as 1.4 at 15 K.
  • Keywords
    barium compounds; calcium compounds; critical currents; high-temperature superconductors; lanthanum compounds; magnetic epitaxial layers; superconducting energy gap; superconducting junction devices; superconducting thin films; superconductive tunnelling; yttrium compounds; La0.33Ca0.67MnO3; La0.67Ca0.33MnO3; YBa2Cu3O7-delta; YBa2Cu3O7-La1-Ca2-MnO3-La2-Ca1-MnO3-interface; critical superconducting current; dc sputtering technique; elastic tunneling; electrical properties; giant zero bias conductance; resistance 30 ohm; size 100 nm; size 7 nm; size 80 nm; spin-polarized carriers injection; superconducting gap-like structure; temperature 15 K; transport mechanism; Conductive films; Electric resistance; Electrical resistance measurement; Josephson junctions; Physics; Polarization; Sputtering; Superconducting epitaxial layers; Thickness measurement; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.374858
  • Filename
    4262260