Title :
Magnetotransport properties in epitaxial La2/3Ca1/3MnO3/La1/3Ca2/3MnO3 superlattices
Author :
Gomez, M.E. ; Campillo, G. ; Ramirez, J.G. ; Hoffmann, A. ; Guimpel, J. ; Haberkorn, N. ; Condo, A. ; Lovey, F. ; Prieto, P.
Author_Institution :
Univ. del Valle, Cali
Abstract :
In this work, we report a study of the temperature dependence of magnetotransport properties for a series of [AF-LCMO (7.6nm)/F-LCMO (tF)]N superlattices. Superlattices of F-LCMO and AF-LCMO layers were grown on (001)-oriented SrTiO3 substrates via a high-pressure dc sputtering process. The modulation period have been experimentally derived from X-ray diffraction measurements, confirming that for all superlattices actual layer thicknesses were within 10% of the nominal values. A high resolution transmission electron microscopy micrograph of a superlattice showing sharp interfaces with interfacial roughness value around 0.38 nm. Atomic force microscopy (AFM) images of the 190 nm-total thickness multilayer show surface roughness below 10 nm. Several properties associated with CMR and exchange bias effects have been studied in F-LCMO/AF-LCMO multilayers.
Keywords :
X-ray diffraction; antiferromagnetic materials; atomic force microscopy; calcium compounds; colossal magnetoresistance; epitaxial growth; exchange interactions (electron); ferromagnetic materials; lanthanum compounds; magnetic multilayers; sputter deposition; surface roughness; transmission electron microscopy; AFM; CMR; La0.67Ca0.33MnO3-La0.33Ca0.67MnO3; X-ray diffraction; antiferromagnetic oxide materials; atomic force microscopy; epitaxial magnetic oxide superlattices; exchange bias effects; ferromagnetic oxide materials; high resolution transmission electron microscopy; high-pressure dc sputtering process; magnetic oxide multilayers; magnetotransport properties; modulation period; surface roughness; Atomic force microscopy; Magnetic properties; Magnetic superlattices; Nonhomogeneous media; Sputtering; Substrates; Temperature dependence; Thickness measurement; X-ray diffraction; X-ray imaging;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.374859
