DocumentCode :
2948343
Title :
Permeability measurements of various magnetic films by a broad band CPW technique
Author :
Jongryoul, K. ; Inyoung, K. ; Hyeon, K. Ki ; Masahiro, Y.
Author_Institution :
Hanyang Univ., Ansan
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
841
Lastpage :
841
Abstract :
Increasing the frequency of electro-magnetic devices has been continuously pushing magnetic materials to operate over several GHz ranges.The permeability measurement of magnetic thin films were performed by both a broadband CPW and a network analyzer (0.1 -20 GHz) and Ryowa permeameter based on a single turn strip loop. The CPW was designed to have near 50Omega impedance, matching the network analyzer and cables. the permeabilities of a CoNbZr films with a film thickness of 2 mum measured by the CPW broad band method. The microstructure of a FeCoNiB thin film observed by transmission electron microscopy.The demagnetization field caused by the signal line can not be a dominant factor in the FeCoNiB film. These two results show that the broad band CPW method is a very effective way to obtain the permeability of magnetic thin films over 10 GHz but requires the careful data analysis including the microstructural characteristics and dimension of magnetic films.
Keywords :
boron alloys; cobalt alloys; coplanar waveguides; demagnetisation; iron alloys; magnetic permeability; magnetic thin films; nickel alloys; niobium alloys; transmission electron microscopy; zirconium alloys; Co85Nb12Zr3; Fe7Co3Ni7B22; Ryowa permeameter; broad band CPW technique; demagnetization field; electro-magnetic devices; magnetic films; microstructural characteristics; network analyzer; permeability measurements; single turn strip loop; size 2 mum; transmission electron microscopy; Coplanar waveguides; Frequency; Impedance; Magnetic analysis; Magnetic films; Magnetic materials; Performance analysis; Performance evaluation; Permeability measurement; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.374872
Filename :
4262274
Link To Document :
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