Title : 
Moire deflectometry diagnostic for transient plasma using a multi-pulse N/sub 2/ laser
         
        
            Author : 
Moosman, B. ; Bystritskii, V.M. ; Wessel, F.J.
         
        
            Author_Institution : 
Dept. of Phys. & Astron., California Univ., Irvine, CA, USA
         
        
        
        
        
        
            Abstract : 
The authors have designed a multi-pulse laser system to measure nanosecond timescale, plasma-density gradients by moire/spl acute/ deflectometry. The complete system consists of four, transverse-excited, atmospheric pressure (TEA) N/sub 2/ laser oscillators and two low-pressure N/sub 2/ laser amplifiers; two oscillator pulses are injected into a single amplifier. The amplified pulses are less than a nanosecond in duration, with a variable, inter-pulse time of 4-10 nanoseconds. Described here, two TEA oscillators and a single amplifier were used to image air-density gradients in an expanding air-shock wave produced by a spark discharge.
         
        
            Keywords : 
gas lasers; laser accessories; measurement by laser beam; moire fringes; optical pumping; plasma density; plasma diagnostics; power supplies to apparatus; pulse generators; pulsed power technology; 4 to 10 ns; N/sub 2/; air-density gradients imaging; expanding air-shock wave; low-pressure N/sub 2/ laser amplifiers; moire/spl acute/ deflectometry; multi-pulse N/sub 2/ laser; oscillator pulses; plasma-density gradients measurement; pulsed power supply; spark discharge; transient plasma diagnostic; transverse-excited atmospheric pressure N/sub 2/ laser oscillators; Collimators; Diffraction; Laser beams; Laser theory; Oscillators; Plasma density; Plasma diagnostics; Plasma measurements; Pulse amplifiers; Pump lasers;
         
        
        
        
            Conference_Titel : 
Pulsed Power Conference, 1995. Digest of Technical Papers., Tenth IEEE International
         
        
            Conference_Location : 
Albuquerque, NM, USA
         
        
            Print_ISBN : 
0-7803-2791-8
         
        
        
            DOI : 
10.1109/PPC.1995.599727