DocumentCode :
2948574
Title :
Large exchange coupling and high thermal stability in synthetic antiferromagnet with ultrathin seed layer
Author :
Fukumoto, Y. ; Honjo, H. ; Igarashi, C. ; Nagase, T. ; Ishiwata, N. ; Ikegawa, S. ; Yoda, H. ; Tahara, S.
Author_Institution :
NEC Corp., Sagamihara
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
857
Lastpage :
857
Abstract :
A synthetic antiferromagnet (SAF) consisting of two ferromagnetic layers antiferromagnetically coupled is a key component for a magnetoresistive element. By using an SAF as a free layer of conventional MRAMs, the switching characteristics and scalability can be improved. Toggle MRAMs must use SAF free layers. When the SAFs that use a spacer layer of Ru are grown on the AlO-barrier layer of magnetic tunnel junctions (MTJs), the antiferromagnetic coupling (AFC) significantly deteriorates. Until now, a thin Ru layer( < 1 nm) has been mostly used for the SAFs to obtain a strong AFC, which is, however, significantly deteriorated by high-temperature( > 300degC) annealing. This is a serious problem for the MgO-barrier MTJs that need high-temperature annealing. To solve these issues, we developed SAFs with an ultrathin seed layer and we used them in toggle MRAMs.
Keywords :
antiferromagnetic materials; exchange interactions (electron); magnetic storage; magnetic tunnelling; magnetoresistive devices; random-access storage; thermal stability; MRAM; antiferromagnetic coupling; exchange coupling; ferromagnetic layers; high-temperature annealing; magnetic tunnel junction; magnetoresistive element; scalability; switching characteristics; synthetic antiferromagnet; thermal stability; ultrathin seed layer; Annealing; Antiferromagnetic materials; Automatic frequency control; Couplings; Laboratories; Magnetic tunneling; National electric code; Saturation magnetization; Thermal stability; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.374888
Filename :
4262290
Link To Document :
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