DocumentCode :
2948804
Title :
Experiences teaching synthesis of FPGAs and testable ASICS
Author :
Bouldin, Donald W.
Author_Institution :
Dept. of Electr. Eng., Tennessee Univ., Knoxville, TN, USA
fYear :
1997
fDate :
21-23 Jul 1997
Firstpage :
85
Lastpage :
86
Abstract :
Microelectronic system designers are increasingly capturing their designs using hardware description languages such as VHDL and Verilog. The designs are then most often synthesized into programmable logic devices such as field-programmable gate arrays (FPGAs). This approach places the emphasis on a high-level design which reduces time to market by relying on synthesis software and programmable logic to produce working prototypes rapidly. These prototypes may then be altered as requirements change or convert into high-volume mask gate arrays or other application-specific integrated circuits (ASICs) when the demand is known to be sufficient. These ASICs, however, must be designed to be testable to screen out those with manufacturing defects. Hence, scan logic must be inserted, test vectors generated and fault grading performed to ensure a high level of testability. Experiences encountered from teaching a two-semester graduate sequence on these topics are summarized
Keywords :
application specific integrated circuits; design for testability; electronic engineering education; field programmable gate arrays; hardware description languages; high level synthesis; teaching; FPGAs; VHDL; Verilog; fault grading; hardware description languages; high-level design; high-volume mask gate arrays; microelectronic system design; scan logic; test vectors generated; testability; testable ASICS; two-semester graduate sequence; Application specific integrated circuits; Circuit testing; Education; Field programmable gate arrays; Hardware design languages; Logic testing; Microelectronics; Programmable logic arrays; Programmable logic devices; Software prototyping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Systems Education, 1997. MSE '97. Proceedings., 1997 IEEE International Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
0-8186-7996-4
Type :
conf
DOI :
10.1109/MSE.1997.612558
Filename :
612558
Link To Document :
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