Title :
Resonant dc/dc converter with class E inverter and class E synchronous rectifier using thinned-out method
Author :
Fujii, Motoki ; Suetugu, T. ; Koizumi, Hirotaka ; Shinoda, Kokichi ; Mori, Shinsaku
Author_Institution :
Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
fDate :
30 Apr-3 May 1995
Abstract :
Class E switches have many advantages in comparison with PWM switches. Their low switching losses allow for high-efficiency operation at high frequency. They can operate with low electro-magnetic interference (EMI). In addition, class E synchronous rectifier has the advantage of low power dissipation in the devices. So it is effective especially in low power circuits. On the other hand, thinned-out method can regulate the output voltage easily by adding a simple logic circuit to the drive circuit. In this paper, we propose to apply the thinned-out method to a class E synchronous rectifier. The experimental circuit is Class E2 resonant dc/dc converter composed of a basic class E inverter and a class E synchronous rectifier. The circuit can regulate the output voltage by controlling (thinning-out) the drive voltage waveforms of the MOSFET in the synchronous rectifier. Some experimental results are shown, and compared with other circuits. At low output power less than 0.4 W, it was maintained over 60 percent for varying the output voltage from 3.0 V to 2.1 V. The maximum measured efficiency is 78 percent
Keywords :
DC-DC power convertors; invertors; rectifiers; resonant power convertors; 0.4 W; 3.0 to 2.1 V; 78 percent; MOSFET waveforms; class E inverter; class E switches; class E synchronous rectifier; drive circuit; electro-magnetic interference; logic circuit; losses; low power circuits; output voltage regulation; power dissipation; resonant DC/DC converter; thinned-out method; Circuits; DC-DC power converters; Frequency; Pulse width modulation converters; Pulse width modulation inverters; Rectifiers; Resonance; Switches; Switching loss; Voltage;
Conference_Titel :
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2570-2
DOI :
10.1109/ISCAS.1995.520343