DocumentCode :
2948887
Title :
A Ballistic Electron Emission Microscopy (BEEM) Study of Metallic Multilayers
Author :
Thompson, J. ; Zhang, T. ; Shen, T. ; Hopkinson, M.
Author_Institution :
Univ. of Salford, Salford
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
876
Lastpage :
876
Abstract :
The hot electron transport properties of bilayer and trilayer structures of the form Au/Fe/Au/GaAs (001) and Au/Fe/GaAs (001) using ballistic electron emission microscopy (BEEM) are studied.
Keywords :
III-V semiconductors; field emission electron microscopy; gallium arsenide; gold; hot carriers; iron; multilayers; Au-Fe-Au-GaAs - Interface; Au-Fe-GaAs - Interface; GaAs; ballistic electron emission microscopy; bilayer structure; hot electron transport properties; metallic multilayers; trilayer structure; Electron emission; Electron microscopy; Gallium arsenide; Giant magnetoresistance; Gold; III-V semiconductor materials; Iron; Magnetoelectronics; Nonhomogeneous media; Spin valves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.374907
Filename :
4262309
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2948887
بازگشت