• DocumentCode
    2948915
  • Title

    High power on-wafer capabilities of a time domain load-pull setup

  • Author

    De Groote, Fabien ; Teyssier, Jean-Pierre ; Verspecht, Jan ; Faraj, Jad

  • Author_Institution
    XLIM, Limoges UniversityIUT GEII, 7 rue Jules Vallÿs 19100 Brive, France
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    100
  • Lastpage
    102
  • Abstract
    High power LSNA on-wafer measurements up to 20 Watts at 2 GHz have been performed on a 3.2 mm gate width AlGaN/GaN HEMT. Time domain slopes in pulsed mode are given for different pulsed drain voltages, showing the importance to monitor the drain voltage and current slopes, as they are directly linked to the transistor reliability. At such power range, the LSNA on-wafer load-pull setup with two dasiawave probespsila couplers demonstrates its capabilities to handle up-to-date power transistors in the S band, and to provide the time domain information usually missing with classical load-pull setups.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; wide band gap semiconductors; AlGaN-GaN; HEMT; LSNA; high power on wafer capabilities; on wafer measurements; time domain load pull setup; Frequency measurement; Performance evaluation; Power generation; Power measurement; Probes; Pulse amplifiers; Pulse measurements; Radio frequency; Time measurement; Voltage; LSNA; on-wafer measurements; power transistors; reliability; time domain measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633312
  • Filename
    4633312