DocumentCode
2948915
Title
High power on-wafer capabilities of a time domain load-pull setup
Author
De Groote, Fabien ; Teyssier, Jean-Pierre ; Verspecht, Jan ; Faraj, Jad
Author_Institution
XLIM, Limoges UniversityIUT GEII, 7 rue Jules Vallÿs 19100 Brive, France
fYear
2008
fDate
15-20 June 2008
Firstpage
100
Lastpage
102
Abstract
High power LSNA on-wafer measurements up to 20 Watts at 2 GHz have been performed on a 3.2 mm gate width AlGaN/GaN HEMT. Time domain slopes in pulsed mode are given for different pulsed drain voltages, showing the importance to monitor the drain voltage and current slopes, as they are directly linked to the transistor reliability. At such power range, the LSNA on-wafer load-pull setup with two dasiawave probespsila couplers demonstrates its capabilities to handle up-to-date power transistors in the S band, and to provide the time domain information usually missing with classical load-pull setups.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; wide band gap semiconductors; AlGaN-GaN; HEMT; LSNA; high power on wafer capabilities; on wafer measurements; time domain load pull setup; Frequency measurement; Performance evaluation; Power generation; Power measurement; Probes; Pulse amplifiers; Pulse measurements; Radio frequency; Time measurement; Voltage; LSNA; on-wafer measurements; power transistors; reliability; time domain measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location
Atlanta, GA
ISSN
0149-645X
Print_ISBN
978-1-4244-1780-3
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2008.4633312
Filename
4633312
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