Title :
A proposed VNA calibration requirement for traceability
Author :
Xinmeng, Liu ; Hui, Huang ; Lee, Yeou-Song
Author_Institution :
National Institute of Metrology, China, No.18 Bei San Huan Dong Lu, Beijing, China, 100013
Abstract :
The status of calibration service for vector network analyzers (VNAs) is introduced. Some recommendations are proposed to provide an efficient and traceable calibration service for VNA.
Keywords :
calibration; network analysers; VNA calibration; microwave electrical characteristics measurement; radiofrequency measurement; traceability; vector network analyzers; Attenuators; Calibration; Frequency measurement; Linearity; Manufacturing; Measurement standards; Noise measurement; Power measurement; Scattering parameters; Testing;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633314
