Title :
A load-pull wafer-mapper
Author :
Vanaverbeke, F. ; Vaesen, K. ; Xiao, D. ; Pauwels, L. ; De Raedt, W. ; Germain, M. ; Degroote, S. ; Das, J. ; Derluyn, J. ; Schreurs, D.
Author_Institution :
IMEC vzw, 3001 Heverlee, Kapeldreef 75, Belgium
Abstract :
This paper describes an automated load-pull measurement test bench for the characterization of GaN power HEMTs. The setup was built around a vector network analyzer (VNA) and an electromechanical tuner. The setup is combined with a semi-automatic wafer-stepper, allowing for complete large-signal wafer-mapping. Both calibration and measurement procedure are explained in mathematical detail.
Keywords :
gallium compounds; high electron mobility transistors; network analysers; power transistors; GaN; automated load-pull measurement test bench; electromechanical tuner; large-signal wafer-mapping; power HEMTs; semiautomatic wafer-stepper; vector network analyzer; Calibration; Gain measurement; Gallium nitride; HEMTs; MODFETs; Performance evaluation; Power measurement; Pulse measurements; Radio frequency; Tuners; Automated; GaN; Load Pull; Waferstepper; wafermaps;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633315
