Title :
Over-determined offset short calibration of a VNA
Author :
Hoffmann, Johannes Paul ; Leuchtmann, Pascal ; Vahldieck, Rüdiger
Author_Institution :
ETH Zurich, IFH, Gloriastrasse 35, CH-8092, Switzerland
Abstract :
Electromagnetic modeling of coaxial 1:85 mm and 1:0 mm standards for Vector Network Analyzer (VNA) calibration shows only limited accuracy. The approach presented in this paper can overcome this accuracy limitation. Instead of handing over the standardspsila S-parameters to the calibration algorithm, parameterized models of the standards are used as input into the calibration algorithm. The technique is demonstrated with an offset short calibration where the unknown phase constant of the shortpsilas parameterized model is estimated with the calibration algorithm. No assumptions on the frequency dependency of the phase constant are needed. Further on we describe the best constellation of the offset shortspsila reflection coefficients in the Smith chart when calibrating a one-port.
Keywords :
calibration; network analysers; parameter estimation; calibration algorithm; offset short calibration; parameter estimation; phase constant; reflection coefficients; vector network analyzer; Calibration; Coaxial components; Connectors; Electromagnetic modeling; Frequency estimation; Parameter estimation; Phase estimation; Propagation constant; Reflection; Scattering parameters; Calibration; Vector Network Analyzer; coaxial connectors; measurement standards; over-determined; parameter estimation;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633318