• DocumentCode
    2949031
  • Title

    A mixed-mode TRL algorithm based on symmetrical reflection standards

  • Author

    Wan, Liang ; Quanli, Li

  • Author_Institution
    School of Electronics and Information Engineering, Beijing University of Aeronautics and Astronautics, 100083, China
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    37
  • Lastpage
    40
  • Abstract
    A mixed-mode TRL calibration algorithm based on symmetrical reflection standards is proposed for differential devices measurements. According to the passive fixturepsilas generalized reciprocity and the phase relationship between its common-mode and differential-mode transmission parameters, the sign ambiguity is removed and the fixturespsila generalized transfer matrices are obtained for both homogeneous and inhomogeneous transmission lines. To verify the proposed algorithm, it is applied to de-embed the DUTspsila mixed-mode s parameters from measurement data, and the experimental results are compared with that from full wave simulation. The agreement of the data obtained through both approaches indicates that the proposed technique is valid to calibrate linear differential devices.
  • Keywords
    S-parameters; transfer function matrices; differential-mode transmission parameters; full wave simulation; generalized reciprocity; generalized transfer matrices; homogeneous transmission lines; inhomogeneous transmission lines; mixed-mode TRL algorithm; mixed-mode s-parameters; symmetrical reflection standards; Calibration; Electronic equipment testing; Extraterrestrial measurements; Fixtures; Measurement standards; Reflection; Scattering parameters; Symmetric matrices; Transmission line matrix methods; Transmission line measurements; TRL calibration; differential device; generalized reciprocity; scattering parameters measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633320
  • Filename
    4633320