Title :
Advanced Magnetic Nanostructure Characterization via Resonant Soft X-Ray Spectro Holography Imaging in Combination with Microscopic Hysteresis Loop Analysis
Author :
Hellwig, O. ; Eisebitt, S. ; Guenther, C. ; Radu, F. ; Luening, J. ; Schlotter, W.F. ; Stoehr, J.
Author_Institution :
Hitachi Global Storage Technol., San Jose
Abstract :
In this article the coherence and tunable polarization of soft X-ray synchrotron radiation for imaging magnetic nanostructures via Fourier Transform Holography is discussed. This new lens-less imaging technique is based on the direct Fourier inversion of a holographically formed soft X-ray interference pattern. This is based on placing the sample behind a lithographically manufactured mask with a micron-sized sample aperture and a nano-sized reference hole. By exploiting the magnetic dichroism in resonance at the L3 edges of the magnetic transition metals (wavelength ~ 1-2 nm (700-900 eV)), images of magnetic nanostructures have been obtained with a spatial resolution of 50 nm. The technique is transferable to a wide variety of specimen, appears scalable to diffraction-limited resolution (about 2 nm), and is well suited for ultra-fast single-shot imaging with future X-ray free electron laser sources.
Keywords :
X-ray imaging; X-ray spectra; holography; magnetic circular dichroism; magnetic hysteresis; nanostructured materials; Fourier inversion; Fourier transform holography; X-ray free electron laser sources; coherence; electron volt energy 700 eV to 900 eV; lithographically manufactured mask; magnetic dichroism; magnetic nanostructure; magnetic transition metals; microscopic hysteresis loop analysis; resonant soft X-ray spectro holography imaging; soft X-ray interference pattern; soft X-ray synchrotron radiation; tunable polarization; ultra-fast single-shot imaging; wavelength 1 nm to 2 nm; Holography; Image analysis; Magnetic analysis; Magnetic force microscopy; Magnetic hysteresis; Magnetic resonance imaging; Optical imaging; Spatial resolution; X-ray imaging; X-ray lasers;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.374920