• DocumentCode
    2949094
  • Title

    Magnetic phase contrast X-ray microscopy

  • Author

    Fischer, P. ; Sakdinawat, A.E. ; Chang, C. ; Anderson, E.H. ; Attwood, D.T.

  • Author_Institution
    Lawrence Berkeley Nat. Lab., Berkeley
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    890
  • Lastpage
    890
  • Abstract
    This paper reports the use of phase sensitive X-ray optical elements in the soft X-ray transmission microscope beamline to image the magnetic domain structure of Gd25Fe75 amorphous layer at high spatial resolution. The amorphous magnetic material is deposited by electron beam evaporation onto a polyimid substrate exhibiting a pronounced perpendicular magnetic anisotropy. Observations show a magnetic contrast at the boundary of the magnetic domains; i.e. at the domain walls where the magnetization changes its direction. Hence, the availability of the X-ray optical elements adds an important new contrast mechanism to magnetic X-ray microscopy.
  • Keywords
    X-ray microscopy; amorphous magnetic materials; electron beam deposition; gadolinium alloys; iron alloys; magnetic domain walls; perpendicular magnetic anisotropy; Gd25Fe75; amorphous magnetic material; domain walls; electron beam evaporation; magnetic domain structure; magnetic phase contrast X-ray microscopy; magnetization; perpendicular magnetic anisotropy; phase sensitive X-ray optical elements; polyimid substrate; soft X-ray transmission microscope; Amorphous magnetic materials; Electron optics; Magnetic anisotropy; Magnetic domain walls; Magnetic domains; Magnetic force microscopy; Optical microscopy; Optical sensors; Perpendicular magnetic anisotropy; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.374921
  • Filename
    4262323