Recorded bit observation by spin-polarized scanning electron microscopy (spin SEM)

In the present study, we observed the recorded bits in a perpendicular magnetic recording medium by using spin SEM. The results show that spin SEM can observe the detail structure of the recorded bits in a high-density perpendicular magnetic recording medium. Thus, the images of the recorded bits taken by spin SEM will help to study the recording characteristics of a head and a medium by comparing with recorded magnetization simulations.