An extension of existing real-time load pull systems to perform voltage/current waveform reconstruction

A complete system to perform voltage/current waveform reconstruction during single-tone non-linear characterization of on-wafer devices including measurements of source reflection coefficients is presented. The solution is an extension of an existing real time active load pull system, which requires neither modification of the existing instruments nor a complicated calibration procedure or extra pre-characterization of components, thereby preserving all attractive features of the original system such as 100 dB dynamic range. The extension is relatively simple requiring only two comb generators and one additional calibration step to provide a spectacular enhancement of on-wafer characterization capability of non-linear devices.