DocumentCode
2949239
Title
Correlation of accelerometer and microphone data in the “coin tap test”
Author
Wu, Huadong ; Siegel, Mel
Author_Institution
Robotics Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume
2
fYear
1999
fDate
1999
Firstpage
814
Abstract
The “coin tap test” is one of the oldest methods of nondestructive test (NDT). It requires an operator to tap with a coin-like light tool on each point of the structure to be inspected, feeling the subtle difference of impact force and hearing the resulting sound to discriminate defective objects from normal ones. Although this is the one of the most cost-effective NDT methods for detection of delamination in multilayered materials, the test technology still remains largely subjective, and there has been considerably uncertainty about the physical principles behind it. Through analyzing and comparing the different aspects of the impact in the coin-tap test mainly the force measured by an accelerometer in the hammer and the resulting sound recorded with a microphone-this paper seeks a better understanding of the fundamental principles underlying the individual measurement techniques, and it gives a paradigm for sensor fusion via using the data from one modality to select the optimal time window for signal analysis of another modality
Keywords
acoustic correlation; delamination; impact testing; nondestructive testing; sensor fusion; spectral analysis; accelerometer data; coin tap test; coin-like light tool; data correlation; defective objects discrimination; delamination detection; expected force-time curve; impact force; microphone data; multilayered materials; nondestructive test; optimal time window; sensor fusion paradigm; signal analysis; sound power spectrum; Accelerometers; Acoustic testing; Auditory system; Delamination; Force measurement; Force sensors; Materials testing; Microphones; Nondestructive testing; Signal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location
Venice
ISSN
1091-5281
Print_ISBN
0-7803-5276-9
Type
conf
DOI
10.1109/IMTC.1999.776979
Filename
776979
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