Title :
First-principles study on the piezoresistive effect of Ge/Si core/shell Nanowires
Author :
Lei Li ; Shuang-Ying Lei ; Hong Yu ; Qing-An Huang
Author_Institution :
Dept. of Electron. Sci. & Eng., Southeast Univ., Nanjing, China
Abstract :
We have simulated the piezoresistance coefficients (Pie Coefficients) in some certain Germanium nanowire (GeNW), Silicon nanowire (SiNW) and several Ge/Si core/shell nanowires based on the first-principles calculations. All the nanowires are with a same diameter in <;111>; direction and remain unsaturated on surface. In these <;111>; nanowires, It was found that the Pie Coefficients of the SiNW and the Ge1Si3 (Ge/Si core/shell nanowire with three layers of silicon atoms) can reach as much as 35.26 × 10-11Pa-1 and 30.0 × 10-11Pa-1 under 2.5% tension in the longitudinal direction. And all those of the GeNW and the Ge3Si1 (with only one silicon atom layer) almost kept negative values from -1 × 10-11 Pa-1 to -9 × 10-11 Pa-1, whether under compressions or tensions. However, under compressions, the Ge2Si2 (with two layers of silicon atoms surrounded outside) almost had no piezoresistive effect.
Keywords :
ab initio calculations; elemental semiconductors; germanium; nanowires; piezoresistance; piezoresistive devices; silicon; Ge-Si; compressions; nanowire; pie coefficient; piezoresistance coefficients; piezoresistive effect; Atomic layer deposition; Conductivity; Effective mass; Nanowires; Piezoresistance; Silicon; Strain;
Conference_Titel :
Sensors, 2012 IEEE
Conference_Location :
Taipei
Print_ISBN :
978-1-4577-1766-6
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2012.6411348