Title :
Aperture jitter effects in wideband sampling systems
Author :
Kobayashi, Haruo ; Morimura, Masanao ; Kobayashi, Kensuke ; Onaya, Yoshitaka
Author_Institution :
Dept. of Electron. Eng., Gunma Univ., Japan
Abstract :
This paper describes the exact formula of the output noise power for almost any input signal in wideband sampling systems in the presence of aperture jitter. It is also shown that in ADC systems the quantization noise and the noise due to the aperture jitter can be added as the total noise power, and hence the exact formula of signal-to-noise-ratio (SNR) due to them in ADC systems is derived. Then the timing skew problem in the interleaved ADC system, which is similar to the aperture jitter problem, is discussed. We show the exact formula for the noise power due to the timing skews and clarify the difference and similarity between the aperture jitter and timing skew problems. Our theoretical results are confirmed by numerical simulations, and these results are useful for wideband sampling system applications
Keywords :
analogue-digital conversion; jitter; noise; quantisation (signal); signal sampling; ADC systems; SNR; aperture jitter effects; interleaved ADC system; numerical simulations; output noise power; quantization noise; signal-to-noise-ratio; timing skew problem; total noise power; wideband sampling systems; Apertures; Clocks; Frequency; Oscilloscopes; Phase noise; Quantization; Sampling methods; Signal to noise ratio; Timing jitter; Wideband;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776991
