Title :
Ultra thin Nd2Fe14B films with perpendicular magnetic anisotropy
Author :
Morisako, A. ; Liu, X. ; Yamasawa, K.
Author_Institution :
Shinshu Univ., Nagano
Abstract :
In this study, Nd2Fe14B thin films with perpendicular anisotropy at the thickness as thin as 5 nm have been successfully prepared. The suitability of the films as perpendicular magnetic recording media has been discussed. The films were characterized by X-ray diffractometry (XRD), vibrating sample magnetometer (VSM) with maximum applied field 24 kOe, and scanning electron microscopy (SEM). The chemical stability of the films was evaluated by measuring the change of magnetic properties at ambient atmosphere for different capping layer thickness.
Keywords :
X-ray diffraction; boron alloys; iron alloys; magnetic thin films; magnetometers; neodymium alloys; permanent magnets; perpendicular magnetic anisotropy; perpendicular magnetic recording; scanning electron microscopy; Nd2Fe14B; SEM; X-ray diffractometry; XRD; magnetic properties; permanent magnet; perpendicular magnetic anisotropy; perpendicular magnetic recording; scanning electron microscopy; thin films; vibrating sample magnetometer; Anisotropic magnetoresistance; Iron; Magnetic films; Neodymium; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Scanning electron microscopy; Transistors; X-ray diffraction; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.374952
