DocumentCode :
29496
Title :
Design of a Low-Voltage Low-Dropout Regulator
Author :
Chung-Hsun Huang ; Ying-Ting Ma ; Wei-Chen Liao
Author_Institution :
Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
Volume :
22
Issue :
6
fYear :
2014
fDate :
Jun-14
Firstpage :
1308
Lastpage :
1313
Abstract :
A low-voltage low-dropout (LDO) regulator that converts an input of 1 V to an output of 0.85-0.5 V, with 90-nm CMOS technology is proposed. A simple symmetric operational transconductance amplifier is used as the error amplifier (EA), with a current splitting technique adopted to boost the gain. This also enhances the closed-loop bandwidth of the LDO regulator. In the rail-to-rail output stage of the EA, a power noise cancellation mechanism is formed, minimizing the size of the power MOS transistor. Furthermore, a fast responding transient accelerator is designed through the reuse of parts of the EA. These advantages allow the proposed LDO regulator to operate over a wide range of operating conditions while achieving 99.94% current efficiency, a 28-mV output variation for a 0-100 mA load transient, and a power supply rejection of roughly 50 dB over 0-100 kHz. The area of the proposed LDO regulator is only 0.0041 mm2, because of the compact architecture.
Keywords :
CMOS integrated circuits; operational amplifiers; power MOSFET; transient response; voltage regulators; CMOS technology; LDO regulator; closed-loop bandwidth enhancement; current 0 mA to 100 mA; current splitting technique; efficiency 99.94 percent; error amplifier; fast responding transient accelerator; frequency 0 kHz to 100 kHz; low-voltage low-dropout regulator; power MOS transistor; power noise cancellation mechanism; rail-to-rail output stage; size 90 nm; symmetric operational transconductance amplifier; voltage 28 mV; MOSFET; Noise; Power supplies; Regulators; Transient analysis; Transient response; Voltage control; Fast transient response; high power supply rejection; low-dropout (LDO) regulator; low-voltage; small area; small area.;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2013.2265499
Filename :
6555953
Link To Document :
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