Title :
Thermal simulations of multi-chips modules
Author :
Ayadi, Moez ; Abid, Slim ; Ammous, Anis
Author_Institution :
Power Electron. Group (PEG), Ecole Nat. d´´Ing. de Sfax, Sfax
Abstract :
In this paper we studied the thermal behavior of the power hybrid modules. The study lead to correct the junction temperature values estimated from the transit thermal impedance of each component operating alone. The corrections depend on the mutual thermal coupling between the different chips of the hybrid structure. It was noticed that the classic analysis of thermal phenomena in these structures, independently of powers dissipated magnitude and boundary conditions, is not correct.
Keywords :
finite element analysis; multichip modules; thermal management (packaging); junction temperature values; multi-chips modules; mutual thermal coupling; thermal simulations; transit thermal impedance; Boundary conditions; Diodes; Finite element methods; Impedance; Insulated gate bipolar transistors; Mathematical model; Numerical simulation; Power electronics; Temperature; Thermal conductivity;
Conference_Titel :
Electronics, Circuits and Systems, 2005. ICECS 2005. 12th IEEE International Conference on
Conference_Location :
Gammarth
Print_ISBN :
978-9972-61-100-1
Electronic_ISBN :
978-9972-61-100-1
DOI :
10.1109/ICECS.2005.4633398