• DocumentCode
    2949648
  • Title

    Thermal simulations of multi-chips modules

  • Author

    Ayadi, Moez ; Abid, Slim ; Ammous, Anis

  • Author_Institution
    Power Electron. Group (PEG), Ecole Nat. d´´Ing. de Sfax, Sfax
  • fYear
    2005
  • fDate
    11-14 Dec. 2005
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper we studied the thermal behavior of the power hybrid modules. The study lead to correct the junction temperature values estimated from the transit thermal impedance of each component operating alone. The corrections depend on the mutual thermal coupling between the different chips of the hybrid structure. It was noticed that the classic analysis of thermal phenomena in these structures, independently of powers dissipated magnitude and boundary conditions, is not correct.
  • Keywords
    finite element analysis; multichip modules; thermal management (packaging); junction temperature values; multi-chips modules; mutual thermal coupling; thermal simulations; transit thermal impedance; Boundary conditions; Diodes; Finite element methods; Impedance; Insulated gate bipolar transistors; Mathematical model; Numerical simulation; Power electronics; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2005. ICECS 2005. 12th IEEE International Conference on
  • Conference_Location
    Gammarth
  • Print_ISBN
    978-9972-61-100-1
  • Electronic_ISBN
    978-9972-61-100-1
  • Type

    conf

  • DOI
    10.1109/ICECS.2005.4633398
  • Filename
    4633398