• DocumentCode
    2949868
  • Title

    Competing reversal mechanisms and edge roughness in thin micron-scale ferromagnetic ring elements

  • Author

    Hayward, T.J. ; Van Belle, F. ; Bland, J.

  • Author_Institution
    Cambridge Univ., Cambridge
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    940
  • Lastpage
    940
  • Abstract
    The results of micromagnetic simulations which investigate the role of edge roughness in the switching behaviour of micrometer-scale permalloy rings is presented and show that the change in behaviour observed in thin elements can be explained by the effect the roughness has on the local spin dynamics of the ring.
  • Keywords
    Permalloy; ferromagnetic materials; magnetic domain walls; magnetic hysteresis; magnetic switching; spin dynamics; Ni80Fe20; Permalloy rings; domain walls; edge roughness; hysteresis loops; micromagnetic simulations; reversal mechanisms; spin dynamics; switching behaviour; thin micron-scale ferromagnetic ring elements; Geometry; Laboratories; Magnetic devices; Magnetic domain walls; Magnetic domains; Magnetic multilayers; Magnetic switching; Magnetization; Micromagnetics; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.374971
  • Filename
    4262373
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2949868