• DocumentCode
    2949896
  • Title

    Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy

  • Author

    Chang, Y. ; Chang, C. ; Wu, J. ; Wei, Z. ; Chang, Carole

  • Author_Institution
    Taiwan SPIN Res. Center, Changhua
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    941
  • Lastpage
    941
  • Abstract
    In this paper, we investigate the magnetization reversal at the junction of a single layer microstructured permalloy cross via magnetoresistance measurement, planar Hall measurement, and magnetic force microscope (MFM). Magnetoresistance (MR) measurements were carried out with a nominal dc current introduced and the voltage drop measured across the longitudinal voltage pair under the magnetic field applied parallel/perpendicular to the current direction, whereas the planar Hall was studied with the same setup but the voltage drop was measured across the transverse Hall voltage pair. A transverse voltage measurement of permalloy cross in which the magnetization reversal process of arms induced the rotation of Mj, thus introducing a dramatic change of magnetic scattering correlated to transverse voltage.
  • Keywords
    Hall effect; Permalloy; magnetic force microscopy; magnetisation reversal; FeNi; magnetic force microscopy; magnetic scattering; magnetization reversal; permalloy; planar hall measurement; Arm; Current measurement; Force measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetization reversal; Magnetoresistance; Scattering; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.374972
  • Filename
    4262374