Title :
Fabrication of high-value standard resistors
Author :
Dziuba, R.F. ; Jarrett, D.G. ; Scott, L.L. ; Secula, A.J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
NIST has fabricated stable, transportable 10 M/spl Omega/ and 1 G/spl Omega/ standard resistors for use in an international comparison of high resistances. This fabrication process is being applied to the construction of standard resistors of values up to 100 T/spl Omega/, with initial results indicating significant improvements in stability and fewer adverse effects induced by mechanical shock and vibration.
Keywords :
ageing; electric resistance measurement; glass-metal seals; heat treatment; measurement uncertainty; thin film resistors; transfer standards; 1 Gohm; 10 Mohm; 100 Tohm; fabrication; film-type resistors; glass-metal seals; heat treatment; hermetic sealing; high resistances; high-value standard resistors; improved stability; international comparison; pre-ageing; reduced shock effects; reduced vibration effects; transfer standards; transportable standard resistors; uncertainties; wirewound resistors; Assembly; Conductivity; Electric shock; Fabrication; NIST; Resistors; Stability; Surface resistance; Vibrations; Wire;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699924
