Title :
Effect of Oxygen Bombardment on Structural and Magnetic Properties of Ion-beam Deposited NiFe/Fe-oxide Bilayers
Author :
Lin, K. ; Ko, P. ; Liu, C. ; Guo, Z. ; Van Lierop, J.
Author_Institution :
Nat. Chung Hsing Univ., Taichung
Abstract :
In this paper, the potential for new device materials and insight into the effects of some of the different iron oxide forms on exchange bias with NiFe (Permalloy) was discussed. The iron-oxides have significantly different magnetic properties. Thin film bilayers were deposited using a dual ion-beam deposition technique that produced an antiferromagnetic iron-oxide layer composition that ranged from Fe3O4 to Fe2O3. The crystal structures of the Fe-oxide films were characterized by X-ray diffractometry (XRD). A JEOL (JEM-2010) Transmission electron microscope (TEM) operating at 200 kV was used for microstructural analysis. The magnetic properties such as exchange coupling and magnetic hysteresis of these bilayers were characterized using a vibrating sample magnetometer (VSM) and a superconducting quantum interference device (SQUID) magnetometry.
Keywords :
Permalloy; X-ray diffraction; antiferromagnetic materials; exchange interactions (electron); ferrimagnetic materials; ion beam assisted deposition; iron compounds; magnetic hysteresis; magnetic multilayers; transmission electron microscopy; NiFe-Fe2O3; NiFe-Fe3O4; Permalloy; SQUID; TEM; VSM; X-ray diffractometry; XRD; antiferromagnetic iron-oxide layer; crystal structures; exchange bias; exchange coupling; ion-beam deposited bilayers; magnetic hysteresis; magnetic properties; microstructural analysis; oxygen bombardment; superconducting quantum interference device magnetometry; thin film bilayers; transmission electron microscopy; vibrating sample magnetometer; voltage 200 V; Antiferromagnetic materials; Crystal microstructure; Iron; Magnetic films; Magnetic materials; Magnetic properties; Oxygen; SQUIDs; Sputtering; Superconducting films;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.374981
