• DocumentCode
    2950064
  • Title

    Bacterial biofilm disruption using laser generated shockwaves

  • Author

    Taylor, Zachary D. ; Navarro, Artemio ; Kealey, Colin P. ; Beenhouwer, David ; Haake, David A. ; Grundfest, Warren S. ; Gupta, Vijay

  • Author_Institution
    Dept. of Bioeng., UCLA, Los Angeles, CA, USA
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 4 2010
  • Firstpage
    1028
  • Lastpage
    1032
  • Abstract
    A system was built to test the efficacy of bacterial biofilm disruption using laser generated shockwaves. The system is based on a Q-switched, ND:YAG pulsed laser operating at a rep rate of 10 Hz with 1500 mJ pulses centered at 1064 nm. The laser pulses were used to create shockwave pulses in Al coated polycarbonate substrates and a resulting peak stress of greater than 50 MPa was measured. These stress pulses were coupled to bacteria grown to confluence on agar plates and cell death as a result of shockwave stress was assessed. The results show a 55% reduction in the number living bacteria between shocked and control samples. This type of biofilm disruption method could prove useful in the treatment of infected wounds where standard treatment methods such as debridement and topical antibiotics have proven to be ineffectual or harmful.
  • Keywords
    biomechanics; cellular biophysics; laser applications in medicine; microorganisms; patient treatment; shock wave effects; wounds; Q-switched Nd-YAG pulsed laser; agar plates; aluminium coated polycarbonate substrates; bacterial biofilm disruption; energy 1500 mJ; infected wound treatment; laser generated shockwaves; shockwave stress induced cell death; stress pulses; wavelength 1064 nm; Electron tubes; Equations; Measurement by laser beam; Microorganisms; Stress; Substrates; Wounds; Biofilms; Cell Survival; Lasers; Radiation Dosage; Staphylococcus aureus; Sterilization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
  • Conference_Location
    Buenos Aires
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4123-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2010.5627726
  • Filename
    5627726