Title :
Statistical error analysis of VLSI architectures: methodology and a case study
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
Abstract :
A methodology is presented for the statistical analysis of the arithmetic error of VLSI architectures. Attention is focused on predicting the arithmetic errors of the overall architecture as a function of register lengths, the type of word representations used, and the precision of the arithmetic blocks (adder/subtracters, multipliers, shifters, dividers, etc.). The methodology is demonstrated by application to a newly developed for use in a large-scale signal processing wafer architecture, a L-U decomposition array. The wafer design, intended for radar signal processing, is part of an ongoing effort on restructurable wafer-scale integration for large-scale signal processing
Keywords :
VLSI; digital signal processing chips; error analysis; error statistics; radar equipment; L-U decomposition array; VLSI architectures; arithmetic error; arithmetic precision; large-scale signal processing wafer; radar signal processing; register lengths; statistical error analysis; wafer design; wafer-scale integration; Arithmetic; Array signal processing; Error analysis; Large scale integration; Large-scale systems; Radar signal processing; Signal design; Statistical analysis; Very large scale integration; Wafer scale integration;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 1990. ICASSP-90., 1990 International Conference on
Conference_Location :
Albuquerque, NM
DOI :
10.1109/ICASSP.1990.116120