• DocumentCode
    2950076
  • Title

    Statistical error analysis of VLSI architectures: methodology and a case study

  • Author

    Jain, V.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    1990
  • fDate
    3-6 Apr 1990
  • Firstpage
    1089
  • Abstract
    A methodology is presented for the statistical analysis of the arithmetic error of VLSI architectures. Attention is focused on predicting the arithmetic errors of the overall architecture as a function of register lengths, the type of word representations used, and the precision of the arithmetic blocks (adder/subtracters, multipliers, shifters, dividers, etc.). The methodology is demonstrated by application to a newly developed for use in a large-scale signal processing wafer architecture, a L-U decomposition array. The wafer design, intended for radar signal processing, is part of an ongoing effort on restructurable wafer-scale integration for large-scale signal processing
  • Keywords
    VLSI; digital signal processing chips; error analysis; error statistics; radar equipment; L-U decomposition array; VLSI architectures; arithmetic error; arithmetic precision; large-scale signal processing wafer; radar signal processing; register lengths; statistical error analysis; wafer design; wafer-scale integration; Arithmetic; Array signal processing; Error analysis; Large scale integration; Large-scale systems; Radar signal processing; Signal design; Statistical analysis; Very large scale integration; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 1990. ICASSP-90., 1990 International Conference on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.1990.116120
  • Filename
    116120