DocumentCode
2950131
Title
Control and enhancement of graphene sensitivity by engineering edge defects
Author
Xuebin Tan ; Huard, C. ; Hsun-Jen Chuang ; Ming-Wei Lin ; Zhixian Zhou ; Cheng, Mark Ming-Cheng
Author_Institution
Electr. & Comput. Eng, Wayne State Univ., Detroit, MI, USA
fYear
2012
fDate
28-31 Oct. 2012
Firstpage
1
Lastpage
4
Abstract
This paper presents a novel design to control defect sites and to enhance sensitivity in graphene-based pH and biological sensors. We showed that pristine graphene was not sensitive to the pH. We demonstrated that the pH sensitivity of graphene could be controlled by varying the patterns and lengths of edges that were created using simple processes of photolithography and dry etching.
Keywords
biosensors; chemical sensors; etching; field effect transistors; graphene; pH measurement; photolithography; C; biological sensor; defect site control; dry etching; engineering edge defects; graphene based pH sensor; graphene sensitivity; photolithography process; Copper; FETs; Graphene; Image edge detection; Logic gates; Sensitivity; Sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2012 IEEE
Conference_Location
Taipei
ISSN
1930-0395
Print_ISBN
978-1-4577-1766-6
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2012.6411386
Filename
6411386
Link To Document