Title :
Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers
Author :
Kim, D. ; Kim, C. ; Kim, Chong-Kwon ; Tsunoda, M. ; Naka, M. ; Takahashi, M.
Author_Institution :
Chungnam Nat. Univ., Taejon
Abstract :
In this work, we measured the Hex and Hc with field angle in the conditions of dAF>dc and dAF< dc. The critical angle behavior in polycrystalline CoFe/Mnlr bilayers has been systematically analyzed by using the modified S-W model. Magnetization curves with magnetic field angle from 0 to 180 degree were measured with a Magneto-Optic Kerr Effect (MOKE) instrument. The CoFe layer thickness is constant of 100 nm, therefore, the critical angle depend on J values.
Keywords :
Kerr magneto-optical effect; cobalt alloys; exchange interactions (electron); iridium alloys; iron alloys; magnetisation; manganese alloys; CoFe-MnIr; S-W model; coercivity; critical angle behaviour; exchange bias; magnetization curves; polycrystalline bilayers; size 100 nm; Anisotropic magnetoresistance; Antiferromagnetic materials; Coercive force; Coupled mode analysis; Goniometers; Magnetic analysis; Magnetic field measurement; Magnetization reversal; Semiconductor device modeling; Thickness measurement;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.374986
