Title :
A New Image Enhancement Algorithm for PCB Defect Detection
Author :
Guan, Shu-an ; Guo, Fenglin
Author_Institution :
Dept. of Comput. & Inf. Eng., Wuhan Polytech. Univ., Wuhan, China
Abstract :
According to the PCB image feature in a PCB defect detection project, we studied a new image enhancement algorithm: double sigmoid transformation and also deduced the transformation arithmetic operator. Practical project experiments show that the new algorithm can effectively sharpen PCB image edges, at same time it can filter out noise in the image. Even if the original PCB image is not distinct enough and uniform brightness, the algorithm is able to precisely locate circuit edge, which can make the edge extracting and edge recognition easier.
Keywords :
edge detection; fault diagnosis; image enhancement; printed circuits; PCB defect detection; PCB image feature; double sigmoid transformation; edge extraction; edge recognition; image enhancement; transformation arithmetic operator; Filtering algorithms; Image edge detection; Image enhancement; Image segmentation; Inspection; Noise; Optical filters; PCB defect detection; Sigmoid arithmetic operator; Sigmoid transformation; image enhancement;
Conference_Titel :
Intelligence Science and Information Engineering (ISIE), 2011 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4577-0960-9
Electronic_ISBN :
978-0-7695-4480-9
DOI :
10.1109/ISIE.2011.54