Title :
Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)
Author :
Koblischka-Veneva, A.D. ; Koblischka, M.R. ; Muecklich, F. ; Murphy, S. ; Zhou, Y. ; Shvets, I.V.
Author_Institution :
Univ. of the Saarland, Saarbrucken
Abstract :
Fe3O4[001] thin films is grown on MgO[001] substrates using oxygen-plasma-assisted molecular beam epitaxy and annealed in air at 250 degC. Automated EBSD scans is performed twice to study the crystallographic orientation by means of recording of Kikuchi patterns.
Keywords :
crystal orientation; electron diffraction; ferromagnetic materials; iron compounds; magnesium compounds; magnetic annealing; magnetic thin films; molecular beam epitaxial growth; plasma deposition; Fe3O4; Kikuchi patterns; MgO; annealing; crystallographic orientations analysis; electron backscatter diffraction; magnetite thin films; oxygen-plasma-assisted molecular beam epitaxy; temperature 250 C; Annealing; Backscatter; Crystallography; Diffraction; Electrons; Iron; Magnetic analysis; Molecular beam epitaxial growth; Substrates; Transistors;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375455
