• DocumentCode
    2950926
  • Title

    Carbon nanotube field effect transistor models performance and evaluation

  • Author

    Al-Shaggah, Atheer ; Rjoub, Abdoul ; Khasawneh, Mahmoud

  • Author_Institution
    Electr. Eng. Dept., Jordan Univ. of Sci. & Technol., Irbid, Jordan
  • fYear
    2013
  • fDate
    3-5 Dec. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a comparison between different models that have studied the effects of several parameter scaling on the performance of Carbon Nano Tube Field Effect Transistors. This evaluation for the studied models, with regard to the scaling effects, is to determine those which best reflect the very essence of Carbon Nano Tubes. Whereas the models subject this comparison (Fettoy, Roy, Stanford, and Southampton) are affected to varying degrees due to such parametric variations, the Stanford model is shown as still being valid for a wide range of chirality and diameters; a model that is also applicable for circuit simulations. Simulations show that the Southampton model was more realistic considering the non-ideality of the carbon nanotube, also with less computational efforts. Results leveraging our findings in this ongoing research endeavor reveal that many research efforts were not efficient to high degree due to high delay and not valid for circuit simulations.
  • Keywords
    carbon nanotube field effect transistors; semiconductor device models; Fettoy model; Roy model; Southampton model; Stanford model; carbon nanotube field effect transistor; carbon nanotube nonideality; circuit simulation; parameter scaling; parametric variation; scaling effect; Accuracy; CNTFETs; Computational modeling; Current-voltage characteristics; Delays; Integrated circuit modeling; Ballistic effects; Carbon nanotube field-effect transistor (CNFET); Carbon nanotubes (CNT); Compact Modeling; SPICE simulations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Electrical Engineering and Computing Technologies (AEECT), 2013 IEEE Jordan Conference on
  • Conference_Location
    Amman
  • Print_ISBN
    978-1-4799-2305-2
  • Type

    conf

  • DOI
    10.1109/AEECT.2013.6716466
  • Filename
    6716466