Title :
Simulation of frequency dependent conductor loss in interconnects
Author :
Divekar, Dileep ; Raghuram, Raj ; Balistreri, Fred ; Matsui, Norio
Author_Institution :
Contec CAE Ltd., San Jose, CA, USA
Abstract :
Simulation of frequency dependence of conductor losses is important for getting accurate electrical performance data of interconnects. The method of characteristics is extended to take into account this effect. The method is well suited for incorporating into a general purpose circuit analysis program for time domain simulation. This enables the analysis of interconnects connected in any arbitrary topology along with the associated nonlinear circuits for high speed digital and analog systems
Keywords :
circuit analysis computing; integrated circuit interconnections; losses; multichip modules; network topology; strip line circuits; time-domain analysis; MCM interconnects; arbitrary topology interconnects; circuit analysis program; electrical performance data; frequency dependent conductor loss; method of characteristics; nonlinear circuits; time domain simulation; Analytical models; Circuit analysis; Circuit simulation; Circuit topology; Conductors; Frequency dependence; Integrated circuit interconnections; Nonlinear circuits; Performance loss; Time domain analysis;
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3286-5
DOI :
10.1109/ECTC.1996.550514
