• DocumentCode
    2951211
  • Title

    An Optimization Technique for the Evaluation of Eddy Current Inspection Data to Determine Weld Quality

  • Author

    Hench, K.W. ; Christensen, W. ; Lopez, A.A. ; Martin, C. ; Phillips, T.T.

  • Author_Institution
    Los Alamos Nat. Lab., NM
  • Volume
    2
  • fYear
    2005
  • fDate
    12-12 Oct. 2005
  • Firstpage
    1535
  • Lastpage
    1539
  • Abstract
    This paper describes the design, engineering, assembly, testing and implementation of an eddy current inspection system to determine weld quality for a laser welding process. This system performs an in situ circumferential weld depth measurement of nuclear weapons primary components during fabrication. The goal of the inspection is to provide an accurate and repeatable estimate of the weld quality while minimizing contact with the part. Eddy current testing is a non-destructive testing (NDT) method used for interrogating conductive materials for defects and metallurgical characteristics. The technique is commonly used in the construction, aerospace, automotive, chemical processing, and power industries to examine structural components for cracks and voids and to study material properties such as hardness, embrittlement, permeability, and conductivity. This paper presents an analysis technique for the evaluation of eddy current data for the determination of weld quality
  • Keywords
    eddy current testing; inspection; laser beam welding; manufacturing data processing; optimisation; circumferential weld depth measurement; eddy current inspection data; laser welding process; metallurgical characteristics; nondestructive testing; nuclear weapons; optimization technique; weld quality; Aerospace materials; Assembly systems; Design engineering; Eddy current testing; Eddy currents; Inspection; Optical design; Performance evaluation; System testing; Welding; Eddy current inspection; parameter optimization; weld quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 2005 IEEE International Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    0-7803-9298-1
  • Type

    conf

  • DOI
    10.1109/ICSMC.2005.1571365
  • Filename
    1571365